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Livres
Articles (83)
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1

1D modelling of dam-break surges with floating debris

Stefano Mambretti, Enrico Larcan, Daniele De Wrachien

Journal:

Biosystems Engineering

Année:

2008

Langue:

english

Fichier:

PDF, 572 KB

english, 2008

2

Irrigation and drainage systems research and development in the 21st century

Bart Schultz, Daniele De Wrachien

Journal:

Irrigation and Drainage

Année:

2002

Langue:

english

Fichier:

PDF, 289 KB

english, 2002

3

Enhanced permanent degradation of organic TFT under electrical stress and visible light exposure

N. Wrachien, D. Bari, J. Kovac, J. Jakabovic, D. Donoval, G. Meneghesso, A. Cester

Journal:

Microelectronics Reliability

Année:

2012

Langue:

english

Fichier:

PDF, 403 KB

english, 2012

4

Water Management for Sustainable Agriculture, edited by TheibOweis, Burleigh Dodds Science Publishing Limited, 82 High Street, Sawston, Cambridge, UK, 2018, ISBN 978-1-78676-176-7 (hardback), 589 pp.

de Wrachien, Daniele

Journal:

Irrigation and Drainage

Année:

2018

Langue:

english

Fichier:

PDF, 81 KB

english, 2018

5

Global warming and drainage development: perspective and challenges

Daniele De Wrachien, Reinder Feddes

Journal:

Irrigation and Drainage

Année:

2004

Langue:

english

Fichier:

PDF, 89 KB

english, 2004

6

Water in Central Asia: Past, present and future, Victor A. Dukhovny and Joop L.G. de Schutter. CRC Press/Balkema, Taylor & Francis Group, London, UK, 2011. ISBN 978-0-415-45962-4 (hardback), 410 pp.

Daniele de Wrachien

Journal:

Irrigation and Drainage

Année:

2011

Langue:

english

Fichier:

PDF, 27 KB

english, 2011

7

Ionising radiation and electrical stress on nanocrystal memory cell array

A. Cester, A. Gasperin, N. Wrachien, A. Paccagnella, V. Ancarani, C. Gerardi

Journal:

Microelectronics Reliability

Année:

2007

Langue:

english

Fichier:

PDF, 447 KB

english, 2007

8

Thermal and electrical stress effects of electrical and optical characteristics of Alq3/NPD OLED

A. Cester, D. Bari, J. Framarin, N. Wrachien, G. Meneghesso, S. Xia, V. Adamovich, J.J. Brown

Journal:

Microelectronics Reliability

Année:

2010

Langue:

english

Fichier:

PDF, 1.01 MB

english, 2010

9

Thermal stress effects on Dye-Sensitized Solar Cells (DSSCs)

D. Bari, N. Wrachien, R. Tagliaferro, S. Penna, T.M. Brown, A. Reale, A. Di Carlo, G. Meneghesso, A. Cester

Journal:

Microelectronics Reliability

Année:

2011

Langue:

english

Fichier:

PDF, 1.01 MB

english, 2011

10

Reliability study of dye-sensitized solar cells by means of solar simulator and white LED

D. Bari, N. Wrachien, R. Tagliaferro, T.M. Brown, A. Reale, A. Di Carlo, G. Meneghesso, A. Cester

Journal:

Microelectronics Reliability

Année:

2012

Langue:

english

Fichier:

PDF, 608 KB

english, 2012

11

[IEEE 2013 IEEE International Reliability Physics Symposium (IRPS) - Anaheim, CA (2013.4.14-2013.4.18)] 2013 IEEE International Reliability Physics Symposium (IRPS) - Study of the effects of UV-exposure on dye-sensitized solar cells

Bari, D., Wrachien, N., Meneghesso, G., Andrea, C., Tagliaferro, R., Brown, T. M., Reale, A., Di Carlo, A.

Année:

2013

Langue:

english

Fichier:

PDF, 455 KB

english, 2013

12

Effects of constant voltage stress on p- and n-type organic thin film transistors with poly(methyl methacrylate) gate dielectric

Wrachien, N., Cester, A., Bari, D., Capelli, R., D’Alpaos, R., Muccini, M., Stefani, A., Turatti, G., Meneghesso, G.

Journal:

Microelectronics Reliability

Année:

2013

Langue:

english

Fichier:

PDF, 641 KB

english, 2013

13

Comparison between positive and negative constant current stress on dye-sensitized solar cells

Bari, D., Wrachien, N., Tagliaferro, R., Brown, T.M., Reale, A., Di Carlo, A., Meneghesso, G., Cester, A.

Journal:

Microelectronics Reliability

Année:

2013

Langue:

english

Fichier:

PDF, 1.49 MB

english, 2013

14

Stress-induced degradation of p- and n-type organic thin-film-transistors in the ON and OFF states

Wrachien, N., Cester, A., Lago, N., Meneghesso, G., D’Alpaos, R., Stefani, A., Turatti, G., Muccini, M.

Journal:

Microelectronics Reliability

Année:

2014

Langue:

english

Fichier:

PDF, 478 KB

english, 2014

15

Near-UV Irradiation Effects on Pentacene-Based Organic Thin Film Transistors

Wrachien, Nicola, Cester, Andrea, Bari, Daniele, Kovac, Jaroslav, Jakabovic, Jan, Donoval, Daniel, Meneghesso, Gaudenzio

Journal:

IEEE Transactions on Nuclear Science

Année:

2011

Langue:

english

Fichier:

PDF, 888 KB

english, 2011

16

Effects of constant voltage and constant current stress in PCBM:P3HT solar cells

Cester, A., Rizzo, A., Bazzega, A., Lago, N., Favaro, J., Barbato, M., Wrachien, N., Gevorgyan, S.A., Corazza, M., Krebs, F.C.

Journal:

Microelectronics Reliability

Année:

2015

Langue:

english

Fichier:

PDF, 1.05 MB

english, 2015

17

Application of an Open-Circuit Voltage Decay Model to Compare the Performances of Donor Polymers in Bulk Heterojunction Solar Cells

Torto, Lorenzo, Cester, Andrea, Wrachien, Nicola, Rizzo, Antonio, Gedefaw, Desta, Andersson, Mats R., Seri, Mirko, Muccini, Michele

Journal:

IEEE Journal of Photovoltaics

Année:

2018

Langue:

english

Fichier:

PDF, 1.24 MB

english, 2018

18

Understanding lead iodide perovskite hysteresis and degradation causes by extensive electrical characterization

Rizzo, Antonio, Lamberti, Francesco, Buonomo, Marco, Wrachien, Nicola, Torto, Lorenzo, Lago, Nicolò, Sansoni, Simone, Pilot, Roberto, Prato, Mirko, Michieli, Nicolò, Meneghetti, Moreno, Meneghesso, Ga

Journal:

Solar Energy Materials and Solar Cells

Année:

2019

Langue:

english

Fichier:

PDF, 1.36 MB

english, 2019

19

Effects of stair case gate bias stress in IGZO/Al2O3 flexible TFTs

Buonomo, M., Wrachien, N., Lago, N., Cantarella, G., Cester, A.

Journal:

Microelectronics Reliability

Année:

2018

Langue:

english

Fichier:

PDF, 795 KB

english, 2018

20

Analysis of the effects of voltage pulses on P3HT:PCBM polymeric solar cells by means of TLP technique

Buonomo, M., Torto, L., Barbato, M., Wrachien, N., Rizzo, A., Gevorgyan, S.A., Krebs, F.C., Cester, A.

Journal:

Microelectronics Reliability

Année:

2018

Langue:

english

Fichier:

PDF, 810 KB

english, 2018

21

Performance assessment of sprinkler irrigation systems: a new indicator for spray evaporation losses

Giulio Lorenzini, Daniele De Wrachien

Journal:

Irrigation and Drainage

Année:

2005

Langue:

english

Fichier:

PDF, 288 KB

english, 2005

22

Theoretical and experimental analysis of debris flow: rheology and two-phase modelling

Stefano Mambretti, Enrico Larcan, Daniele De Wrachien

Journal:

Irrigation and Drainage

Année:

2008

Langue:

english

Fichier:

PDF, 261 KB

english, 2008

23

Conjunctive use of surface and groundwater: overview and perspective

Daniele de Wrachien, Costantino A. Fasso

Journal:

Irrigation and Drainage

Année:

2002

Langue:

english

Fichier:

PDF, 108 KB

english, 2002

24

Flood management and risk assessment in flood-prone areas: Measures and solutions

Daniele De Wrachien, Stefano Mambretti, Bart Schultz

Journal:

Irrigation and Drainage

Année:

2011

Langue:

english

Fichier:

PDF, 302 KB

english, 2011

25

Modelling Jet Flow and Losses in Sprinkler Irrigation: Overview and Perspective of a New Approach

D. De Wrachien, G. Lorenzini

Journal:

Biosystems Engineering

Année:

2006

Langue:

english

Fichier:

PDF, 226 KB

english, 2006

26

Paddy and Water Environment: Facilitation information exchange and identifying future R & D needs

Daniele De Wrachien

Journal:

Paddy and Water Environment

Année:

2003

Langue:

english

Fichier:

PDF, 117 KB

english, 2003

27

Theoretical and Experimental Analysis of Spray Flow and Evaporation in Sprinkler Irrigation

Giulio Lorenzini, Daniele De Wrachien

Journal:

Irrigation and Drainage Systems

Année:

2004

Langue:

english

Fichier:

PDF, 127 KB

english, 2004

28

Visible Light and Low-Energy UV Effects on Organic Thin-Film Transistors

Wrachien, N., Cester, A., Bari, D., Jakabovic, J., Kovac, J., Donoval, D., Meneghesso, G.

Journal:

IEEE Transactions on Electron Devices

Année:

2012

Langue:

english

Fichier:

PDF, 834 KB

english, 2012

29

Reliability Study of Ruthenium-Based Dye-Sensitized Solar Cells (DSCs)

Bari, D., Cester, A., Wrachien, N., Ciammaruchi, L., Brown, T.M., Reale, A., Di Carlo, A., Meneghesso, G.

Journal:

IEEE Journal of Photovoltaics

Année:

2012

Langue:

english

Fichier:

PDF, 684 KB

english, 2012

30

Impact of Trapped Charge and Interface Defects on the Degradation of the Optical and Electrical Characteristics in OLEDs

Pinato, A., Cester, A., Meneghini, M., Wrachien, N., Tazzoli, A., Xia, S., Adamovich, V., Weaver, M.S., Brown, J.J., Zanoni, E., Meneghesso, G.

Journal:

IEEE Transactions on Electron Devices

Année:

2010

Langue:

english

Fichier:

PDF, 946 KB

english, 2010

31

[IEEE 2011 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2011.04.10-2011.04.14)] 2011 International Reliability Physics Symposium - Optical stress and reliability study of ruthenium-based dye-sensitized solar cells (DSSC)

Bari, Daniele, Wrachien, Nicola, Cester, Andrea, Meneghesso, Gaudenzio, Tagliaferro, Roberto, Penna, Stefano, Brown, Thomas M., Reale, Andrea, Di Carlo, Aldo

Année:

2011

Langue:

english

Fichier:

PDF, 308 KB

english, 2011

32

Quantum mechanics applied to the dynamic assessment of a cluster of water particles in sprinkler irrigation

D. De Wrachien, G. Lorenzini

Journal:

Journal of Engineering Thermophysics

Année:

2012

Langue:

english

Fichier:

PDF, 444 KB

english, 2012

33

MANAGEMENT OF DRIP/TRICKLE OR MICRO IRRIGATION, EDITED BY MEGH RAJGOYAL. APPLE ACADEMIC PRESS, TORONTO AND NEW JERSEY, 2012. ISBN: 978-1-926895-12-3 (HARDBACK), 408 PP.

de Wrachien, Daniele

Journal:

Irrigation and Drainage

Année:

2012

Langue:

english

Fichier:

PDF, 41 KB

english, 2012

34

Total Ionizing Dose Effects on 4 Mbit Phase Change Memory Arrays

Gasperin, Alberto, Wrachien, Nicola, Paccagnella, Alessandro, Ottogalli, Federica, Corda, Ugo, Fuochi, Piergiorgio, Lavalle, Marco

Journal:

IEEE Transactions on Nuclear Science

Année:

2008

Langue:

english

Fichier:

PDF, 817 KB

english, 2008

35

Water drops kinematic analysis: the classic-quantum and single-multiparticle viewpoints

Daniele De Wrachien, Giulio Lorenzini

Journal:

Central European Journal of Engineering

Année:

2013

Langue:

english

Fichier:

PDF, 235 KB

english, 2013

36

[IEEE 2012 IEEE International Reliability Physics Symposium (IRPS) - Anaheim, CA, USA (2012.04.15-2012.04.19)] 2012 IEEE International Reliability Physics Symposium (IRPS) - Effects of channel hot carrier stress on III–V bulk planar MOSFETs

Wrachien, N., Cester, A., Bari, D., Zanoni, E., Meneghesso, G., Wu, Y.Q., Ye, P.D.

Année:

2012

Langue:

english

Fichier:

PDF, 526 KB

english, 2012

37

[IEEE 2009 Proceedings of the European Solid State Device Research Conference (ESSDERC) - Athens, Greece (2009.09.14-2009.09.18)] 2009 Proceedings of the European Solid State Device Research Conference - Organic TFT with SiO2-parylene gate dielectric stack and optimized pentacene growth temperature

Wrachien, Nicola, Cester, Andrea, Pinato, Alessandro, Meneghini, Matteo, Tazzoli, Augusto, Meneghesso, Gaudenzio, Kovac, Jaroslav, Jakabovic, Jan, Donoval, Daniel

Année:

2009

Langue:

english

Fichier:

PDF, 1.08 MB

english, 2009

38

[IEEE 2009 IEEE International Reliability Physics Symposium (IRPS) - Montreal, QC, Canada (2009.04.26-2009.04.30)] 2009 IEEE International Reliability Physics Symposium - Threshold voltage instability in organic TFT with SiO2 and SiO2/parylene-stack dielectrics

Wrachien, Nicola, Cester, Andrea, Pinato, Alessandro, Meneghini, Matteo, Tazzoli, Augusto, Meneghesso, Gaudenzio, Kovac, Jaroslav, Jakabovic, Jan, Donoval, Daniel

Année:

2009

Langue:

english

Fichier:

PDF, 357 KB

english, 2009

39

[IEEE 2009 IEEE International Reliability Physics Symposium - Montreal, QC, Canada (2009.04.26-2009.04.30)] 2009 IEEE International Reliability Physics Symposium - Improved reliability of organic light-emitting diodes with indium-zinc-oxide anode contact

Pinato, A., Meneghini, M., Cester, A., Wrachien, N., Tazzoli, A., Zanoni, E., Meneghesso, G., D'Andrade, B., Esler, J., Xia, S., Brown, J.

Année:

2009

Langue:

english

Fichier:

PDF, 659 KB

english, 2009

40

Modeling of Heavy Ion Induced Charge Loss Mechanisms in Nanocrystal Memory Cells

Cester, Andrea, Wrachien, Nicola, Schwank, James R., Vizkelethy, Gyorgy, Portoghese, Rosario, Gerardi, Cosimo

Journal:

IEEE Transactions on Nuclear Science

Année:

2008

Langue:

english

Fichier:

PDF, 788 KB

english, 2008

41

[IEEE 2012 IEEE International Reliability Physics Symposium (IRPS) - Anaheim, CA, USA (2012.04.15-2012.04.19)] 2012 IEEE International Reliability Physics Symposium (IRPS) - Study of the effect of stress-induced trap levels on OLED characteristics by numerical model

Cester, Andrea, Bari, Daniele, Wrachien, Nicola, Meneghesso, Gaundenzio

Année:

2012

Langue:

english

Fichier:

PDF, 360 KB

english, 2012

42

Effects of Positive and Negative Stresses on III–V MOSFETs With $\hbox{Al}_{2}\hbox{O}_{3}$ Gate Dielectric

Wrachien, N., Cester, A., Wu, Y. Q., Ye, P. D., Zanoni, E., Meneghesso, G.

Journal:

IEEE Electron Device Letters

Année:

2011

Langue:

english

Fichier:

PDF, 325 KB

english, 2011

43

Investigation of Proton and X-Ray Irradiation Effects on Nanocrystal and Floating Gate Memory Cell Arrays

Wrachien, Nicola, Cester, Andrea, Portoghese, Rosario, Gerardi, Cosimo

Journal:

IEEE Transactions on Nuclear Science

Année:

2008

Langue:

english

Fichier:

PDF, 390 KB

english, 2008

44

[IEEE 2010 IEEE International Reliability Physics Symposium - Garden Grove (Anaheim), CA, USA (2010.05.2-2010.05.6)] 2010 IEEE International Reliability Physics Symposium - Degradation of III–V inversion-type enhancement-mode MOSFETs

Wrachien, N., Cester, A., Zanoni, E., Meneghesso, G., Wu, Y.Q., Ye, P.D.

Année:

2010

Langue:

english

Fichier:

PDF, 439 KB

english, 2010

45

[IEEE 2012 IEEE International Reliability Physics Symposium (IRPS) - Anaheim, CA, USA (2012.04.15-2012.04.19)] 2012 IEEE International Reliability Physics Symposium (IRPS) - Organic Thin Film Transistor degradation under sunlight exposure

Wrachien, N., Cester, A., Bari, D., Meneghesso, G., Kovac, J., Jakabovic, J., Donoval, D.

Année:

2012

Langue:

english

Fichier:

PDF, 374 KB

english, 2012

46

[IEEE 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual - Phoenix, AZ, USA (2007.04.15-2007.04.19)] 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual - Role of Oxide/Nitride Interface Traps on the Nanocrystal Memory Characteristics

Gasperin, Alberto, Cester, Andrea, Wrachien, Nicola, Paccagnella, Alessandro, Gerardi, Cosimo, Ancarani, Valentina

Année:

2007

Langue:

english

Fichier:

PDF, 2.22 MB

english, 2007

47

[IEEE 2010 IEEE International Reliability Physics Symposium - Garden Grove (Anaheim), CA, USA (2010.05.2-2010.05.6)] 2010 IEEE International Reliability Physics Symposium - Light, bias, and temperature effects on organic TFTs

Wrachien, N., Cester, A., Bellaio, N., Pinato, A., Meneghini, M., Tazzoli, A., Meneghesso, G., Myny, K., Smout, S., Genoe, J.

Année:

2010

Langue:

english

Fichier:

PDF, 433 KB

english, 2010

48

Radiation Tolerance of Nanocrystal-Based Flash Memory Arrays Against Heavy Ion Irradiation

Cester, Andrea, Wrachien, Nicola, Gasperin, Alberto, Paccagnella, Alessandro, Portoghese, Rosario, Gerardi, Cosimo

Journal:

IEEE Transactions on Nuclear Science

Année:

2007

Langue:

english

Fichier:

PDF, 573 KB

english, 2007

49

Impact of Heavy-Ion Strikes on Nanocrystal Non Volatile Memory Cell Arrays

Cester, Andrea, Gasperin, Alberto, Wrachien, Nicola, Paccagnella, Alessandro, Ancarani, Valentina, Gerardi, Cosimo

Journal:

IEEE Transactions on Nuclear Science

Année:

2006

Langue:

english

Fichier:

PDF, 316 KB

english, 2006

50

[IEEE 2007 9th European Conference on Radiation and Its Effects on Components and Systems (RADECS 2007) - Deauville, France (2007.09.10-2007.09.14)] 2007 9th European Conference on Radiation and Its Effects on Components and Systems - Total Ionizing Dose effects on 4Mbit Phase Change Memory arrays

Gasperin, Alberto, Wrachien, Nicola, Cester, Andrea, Paccagnella, Alessandro, Ottogalli, Federica, Corda, Ugo, Fuochi, Piergiorgio, Lavalle, Marco

Année:

2007

Langue:

english

Fichier:

PDF, 2.62 MB

english, 2007